PHASE LINEAR 700 SERIE II COMPLETE MATCHED OUTPUT TRANSISTOR SET. THESE OUTPUT TRANSISTORS ARE MATCHED TO FIT THE PHASE LINEAR SERIES II 700 POWER AMP. THESE DIRECT REPLACEMENT ON SEMICONDUCTOR DEVICES ARE RATED AT 250 VOLTS 16AMPS 250WATTS. (According to ON, they have the largest die of any TO-3 power transistor on the market which means they can dissipate more heat and operate more reliably.
YOU WILL RECEIVE (20) HFE MATCHED NPN OUTPUT TRANSISTORS AND (4) HFE MATCHED OUTPUT NPN DRIVER TRANSISTORS. (ENOUGH TO UPGRADE OR REPAIR BOTH CHANNELS OF THE QUASI PL-700 SII AMPLIFIER) FULLY TESTED . YOU WILL ALSO RECEIVE (1) COMPLETE SERVICE MANUAL IN HIGH RESOLUTION PDF FORMAT, (24) NEW MICA INSULATORS AND 3.0 GRAMS OF PURE WHITE SILICONE THERMAL GREASE. AS ALWAYS, THANKS FOR LOOKING.
NOTE: DON'T FORGET TO CHECK BIAS AND OFFSET AFTER INSTALLATION. THIS KIT IS FOR A QUASI(ALL NPN TRANSISTOR OUTPUT STAGE). IF YOU HAVE A FULL COMPLIMENTARY(HALF NPN AND HALF PNP OUTPUT STAGE) CONTACT ME FOR PRICING AND AVAILABILITY AS PHASE LINEAR MANUFACTURED SERIES II AMPS IN BOTH CONFIGURATIONS. IF YOU ARE NOT SURE, EMAIL ME WITH NUMBERS PRINTED ON OUTPUT TRANSISTORS AND I WILL LET YOU KNOW CONFIGURATION.
Features
Perforated Emitter technology
specifically designed for high power audio output, disk head
positioners and linear applications.
• Total Harmonic Distortion Characterized
• High DC Current Gain − hFE = 25 Min @ IC = 8 Adc
• Excellent Gain Linearity
• High SOA: 3 A, 80 V, 1 Sec
MAXIMUM RATINGS
Rating Symbol Value Unit
Collector−Emitter Voltage VCEO 250 Vdc
Collector−Base Voltage VCBO 400 Vdc
Emitter−Base Voltage VEBO 5 Vdc
Collector−Emitter Voltage − 1.5V VCEX 400 Vdc
Collector Current − Continuous
IC 16
30
Adc
Base Current − Continuous IB 5 Adc
Total Device Dissipation @ TC = 25C
Derate above 25C
PD 250
1.43
W
W/C
Operating and Storage Junction
Temperature Range
TJ, Tstg −65 to +200 C
THERMAL CHARACTERISTICS
Characteristics Symbol Max Unit
Thermal Resistance, Junction−to−Case RJC 0.7 C/W
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.