Features

64 MAX macrocells in 4 LABs 8 dedicated inputs, 24 bidirectional I/O pins Programmable interconnect array 0.8-micron double-metal CMOS EPROM technology Available in 44-pin HLCC, PLCC Lowest power MAX device The CY7C343 contains 64 highly flexible macrocells and 128 expander product terms. These resources are divided into four Logic Array Blocks (LABs) connected through the Programmable Inter-connect Array (PIA). There are 8 input pins, one that doubles as a clock pin when needed. The CY7C343 also has 28 I/O pins, each connected to a macrocell (6 for LABs A and C, and 8 for LABs B and D). The remaining 36 macrocells are used for embedded logic. The CY7C343 is excellent for a wide range of both synchronous and asynchronous applications.

The is a high-performance, high-density erasable programmable logic device, available in 44-pin PLCC and HLCC packages.

MACROCELLS 57­64 LAB C MACROCELL 38 MACROCELL 37 MACROCELL 36 MACROCELL 35 MACROCELL 34 MACROCELL 33

MAX is a registered trademark of Altera Corporation. Warp, Warp Professional, and Warp Enterprise are trademarks of Cypress Semiconductor.

(Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature................................. ­65°C to+150°C Ambient Temperature with Power Applied................................................... 0°C to+70°C Maximum Junction Temperature (Under Bias)................................................................. 150°C Supply Voltage to Ground Potential............... to +7.0V Maximum Power mW DC VCC or GND Current............................................500 mA

DC Output Current, per Pin...................... mA DC Input +7.0V DC Program Voltage.................................................... 13.0V Static Discharge Voltage........................................... >1100V (per MIL­STD­883, method 3015)

Range Commercial Industrial Military Ambient Temperature to +125°C (Case) VCC 5V ±10%

Note: 1. Minimum DC input is ­0.3V. During transitions, the inputs may undershoot to ­2.0V for periods less than 20 ns.

Parameter VOH VOL VIH VIL IIX IOZ IOS tR tF Description Output HIGH Voltage Output LOW Voltage Input HIGH Level Input LOW Level Input Current Output Leakage Current Output Short Circuit Current Power Supply Current (Standby) Power Supply Current

­ 0.3 GND < VIN < VCC VO = VCC or GND VCC = Max., VOUT VI = VCC or GND (No Load) VI = VCC or GND (No Load) MHz[4, 5] Commercial Military/Industrial Commercial Military/Industrial

Recommended Input Rise Time Recommended Input Fall Time

Parameter CIN COUT Description Input Capacitance Output Capacitance Test Conditions VIN = 1.0 MHz VOUT = 1.0 MHz Max. 10 Unit pF

464 5V OUTPUT 50 pF INCLUDING JIG AND SCOPE 250 5V OUTPUT 5 pF INCLUDING JIG AND SCOPE 3.0V 10% GND R1 464 ALL INPUT PULSES ns

Notes: 2. Typical values are for = 25°C and VCC 5V. 3. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems caused by tester ground degradation. 4. Guaranteed but not 100% tested. 5. Measured with device programmed a 16-bit counter in each LAB. This parameter is tested periodically by sampling production material. 6. Part (a) in AC Test Load and Waveforms is used for all parameters except tER and tXZ, which is used for part (b) in AC Test Load and Waveforms. All external timing parameters are measured referenced to external pins of the device.