ESR Meter 12864 LCD Transistor Tester Diode Triode Capacitance MOS PNP/NPN
LCR
Description:
Features:
The tester
uses 3.7V rechargeable lithium battery (battery model: 14500) powered portable
design, but you can use the T-MINIUSB outlet to charge the battery and power the
system for a long time in the indoor use of more economical and convenient,
eliminating the need always to be replaced battery of economic
input!
This one is 2015 newest version , bigger Lcd than old
version Features: one key measurement operation, auto power off delay.
Shutdown current is only 20nA, support for battery operation. Automatic
detection PNP and NPN bipolar transistor, N, P-channel MOSFET, JFET FET, diodes,
two diodes, thyristors, resistors, capacitors, inductors. Automatic detection
pin definitions. measuring the current amplification factor (B) of the
bipolar transistor and the turn-on voltage of the emitter junction (Uf).
Darlington transistor amplification factor can be identified by the high
threshold voltage and high current. can detect bipolar transistors and
MOSFET's internal protection diodes and displayed on the screen. measuring
the threshold voltage and the gate capacitance of the MOSFET. Support two
resistance measurements, the potential can be measured. If the potentiometer is
adjusted to its end, the tester can not distinguish between the middle and the
ends of the pin. resistance measurement resolution is 0.1 ohms, the maximum
value of 50M ohms measurements. capacitance measurement range from 25pf to
100mF (100000 UF). Resolution up to 1 pF, inductance measurement range
0.01MH-20H, otherwise it will appear as a resistor, inductor DC resistance is
higher than if Europe 2100 will also be displayed as a resistor. it can
detect 2UF above capacitor equivalent series resistance (ESR), a resolution of
0.01 ohms. This feature is very important for the detection of the capacitor
performance. it can display symbols of the two diodes in the right direction,
also shows the forward voltage drop. LED detection for diode forward voltage
drop higher than normal. Dual LEDs detected as double diode. Simultaneous
detection of light-emitting diodes will flash. time for each test is about
two seconds, only the large capacitance and inductance measurements will take a
long time. Correction: Short three test side, into the test, the screen
prompts correction step. When prompted to disconnect the short end of the
calibration time off three tests will continue, when prompted in the 1-3 foot
access 100nF capacitor over time, access to distribution after correction
capacitors 1uF program will automatically enter the next step. Correction until
the end of the restart to complete the correction. The main parameters and
use: 1 using ATmega8, ATmega168 or ATmega328 microcontroller. 2 2x16
character LCD display results. 3 one-button operation, automatic power
off. 4 shutdown current of only 20nA, support for battery operation. 5
low-cost version without the crystal, auto power off. 1.05k version of the
software ATmega168 or ATmega328 in sleep mode when no measurement to reduce
power consumption. 6 Automatic detection PNP and NPN bipolar transistor, N,
P-channel MOSFET, JFET, diodes, dual diode, thyristor SCR. 7 automatically
detects the pin layout. 8 the threshold voltage and current amplification
factor of the emitter junction of the bipolar transistor measurements. 9
Darlington transistor through a high threshold voltage and high-current
amplification factor identified. 10 pairs of bipolar transistors, MOSFET
protection diode testing. The threshold voltage value 11 and the gate
capacitance of a MOSFET is measured. 12. Supports two resistance measurements
and symbols show the highest four numbers and units. Both ends of the resistor
symbol is shown connected to the tester probes number (1-3). Therefore, the
potential can also be measured. If the potentiometer is adjusted to its end, the
tester can not distinguish between the middle and the ends of the pin. 13
resistance measurement resolution is 0.1 ohms, the highest measured value 50M
ohms. 14 can be detected and measured a capacitor. Maximum four numbers and
units. Values can be from 25pf (8MHz clock, 50pF @ 1MHz clock) to 100mF.
Resolution up to 1 pF (@ 8MHz clock). 15 may be larger than the value for 2UF
capacitor equivalent series resistance (ESR) measured capacitance value.
Resolution of 0.01 ohms and a two-digit numeric display. This feature requires
at least 16K Flash ATMEGA (ATmega168 or ATmega328). 16 can display symbols of
the two diodes in the right direction. In addition, the forward voltage drop
displayed. 17 LED detection for diode forward voltage drop is much higher
than normal. Dual LEDs detected as double diode. Zener diode 18 can be
detected, if the reverse breakdown voltage is less than 4.5V. This will appear
as two diodes, can only be determined by the voltage. Probe around the diode
symbol is the same, in which case, you can 700mV threshold voltage close to the
true recognition diode anode! 19 If more than three diode type parts
inspection, failure to establish the number of diodes another message. This will
only happen if the diode is connected to all three probes and at least one
diode. In this case, you should only connect the two probes and start measuring
again, one by one. 20 measures a single diode reverse capacitance values.
Bipolar transistors also can measure, if you connect the base and collector or
emitter. 21 need to find a measurement of the full-bridge connection. 25pf
capacitor values lower than 22 are usually undetectable, but with a diode in
parallel or at least 25pf capacitor in parallel. In this case, you have to
subtract part shunt capacitance values. 23 ohm resistor will measure
inductance of less than 2100, if you have at least 16K ATMEGA flash. Range from
0: 01mH than 20H, but the accuracy is not good. Measurement results show only a
single connection element. 24 test time is about two seconds, only the
capacitance and inductance measurements will take longer. 25 software can be
set to automatically turn off the power to measure the number of times
before. 26 built-in self-test function with selectable clock frequency of
50Hz signal check the accuracy and wait for the call (ATmega168 and
ATmega328). 27 optional resistance and zero offset calibration of measuring
equipment self-test capability of the port output (ATmega168 and ATmega328).
Need a 100nF to 20uF capacitor connected to compensate the analog comparator
between pins 1 and 3 of the offset voltage. This can reduce the measurement
error 40uF above capacitor. With the same internal calibration capacitor voltage
reference voltage is found to internal adjustment reference measurement ADC
gain. If the test current exceeds the holding current, the thyristor and
triac can be detected. But some current higher than the semiconductor SCR and
triac tester can provide the trigger current. Available test current is only
about 6mA! Note that all functions have only used single-chip program memory as
more ATmega168.
Package Contents 100% Brand
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1 xESR Meter
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