Further Details
Title: Secondary Ion Mass Spectrometry Condition: New Subtitle: Applications for Depth Profiling and Surface Characterization Author: Fred Stevie Format: Paperback EAN: 9781606505885 ISBN: 9781606505885 Publisher: Momentum Press Genre: Technology & Engineering Release Date: 15/09/2015 Description: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique. Language: English Country/Region of Manufacture: US Item Height: 229mm Item Length: 152mm Book Series: Materials Characterization and Analysis Collection Release Year: 2015 Missing Information?
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