Further Details

Title: Secondary Ion Mass Spectrometry
Condition: New
Subtitle: Applications for Depth Profiling and Surface Characterization
Author: Fred Stevie
Format: Paperback
EAN: 9781606505885
ISBN: 9781606505885
Publisher: Momentum Press
Genre: Technology & Engineering
Release Date: 15/09/2015
Description: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Language: English
Country/Region of Manufacture: US
Item Height: 229mm
Item Length: 152mm
Book Series: Materials Characterization and Analysis Collection
Release Year: 2015

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