Description

One key operation with automatic power shutdown. Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs, JFETs, diodes, double diodes, Thyristors and Triacs. . Shutdown current is only about 20nA. Operates with microcontrollers. Automatic detection of pin layout of the detected part. Displaying the results to a 128x64 graphic LCD-Display

Feature

-

Color: As Shown.
- Thyristors and Triacs can only be detected, if the test current is above the holding current. Some Thyristors and Triacs need as higher gate trigger current, than this Tester can deliver. The available testing current is only about 6mA.
- Zener-Diodes can be detected, if reverse break down Voltage is below 4.5V. These are shown as two diodes, you can identify this part only by the voltages. The outer probe numbers, which surround the diode symbols, are identical in this case. You can identify the real Anode of the diode only by the one with break down (threshold) Voltage nearby 700mV.
- Resolution of resistor measurement is now up to 0.01ohms, values up to 50M ohms are detected.
- Can generate a of 1Hz-2MHz.
- Display the Collector current ICE0 with currentless base (10μA units) and Collector residual current ICES with base hold to emitter level . This values are only shown, if they are not zero (especially for Germanium transistors).
- Software can be configured to enable series of measurements before power will be shut down.
Selectable facility to calibrate the internal port of port output and the zero offset of capacity measurement with the selftest . A external capacitor with a value between 100nF and 20μF connected to pin 1 and pin 3 is necessary to compensate the offset voltage of the analog comparator. This can measurement errors of capacitors of up to 40μF. With the capacitor a correction voltage to the internal reference voltage is found to adjust the gain for measuring with the internal reference.
- If more than 3 diode type parts are detected, the number of founded diodes is shown additionally to the fail message. This can only happen, if Diodes are attached to all three probes and at least one is a Z-Diode. In this case you should only connect two probes and start measurement again, one after the other.
- Measuring of current amplication factor and Base-Emitter threshold voltage of bipolar transistors. Darlington transistors can be identified by the threshold voltage and high current amplication factor.
Detection of the protection diode of bipolar transistors and MOSFETs.
- Up to two Resistors are measured and shown with symbols and values with up to four decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the Tester (1-3). So Potentiometer can also be measured.
- Testing time is about two seconds, only capacity or inductance measurement can cause longer period.
- Measurement of the capacity value of a single diode in reverse direction. Bipolar Transistors can also be analysed, if you connect the Base and only one of Collector or Emitter. Only one measurement is needed to out the connections of a bridge rectier.
- Can generate a fixed frequency variable width wave, short key width in 1% increments, the longer the key width of 10% increments.
- Capacitors with value below 25pF are not detectet, but can be measured together with a parallel diode or a parallel capacitor with at least 25pF. In this case you must subtract the capacity value of the parallel connected part.
- One capacitor can be detected and measured. It is shown with symbol and value with up to four decimal digits in the right dimension. The value can be from 25pF to 100mF. The resolution can be up to 1pF .
- Can start a separate capacitance and ESR menu functions, ranges 2UuF-50mF, since the measurement amplitude is only 300mV, so the road can be measured. (Since the non-4-wire measurements, measuring lead may lead to large errors, especially small ESR measurements).
- Measuring of the Gate threshold voltage and Gate capacity value of MOSFETs.
- For capacitors with a capacity value above 5000pF the voltage loss after a load can be determined. The voltage loss give a hint for the quality factor of the capacitor. LED is detected as diode, the aux voltage is much higher than normal. Two-in-one LEDs are also detected as two diodes.
- Material: LCD+PCB+Electronic Component.
- Size: 10 x 8 x 1cm.

1 x Transistor Tester

1.If you have some inquires or problems, Please feel free to contact us.
2.We will reply your email within 1 business day (except weekend).
3.When delivery is delayed or items are damaged during delivery, please email us first before you leave feedback. Thank you.