eBay

Hitachi S-806
Field Emission Scanning Electron Microscope
FE SEM HITACHI

Features and Specification

Features

General Wafer : 6-inch
Broken Sample Secondary Electron Image Resolution : 6nm(60A) - 25KV
Specimen Stage
- Movement Range : X and Y 0 to 150mm
- Stage Drive : Pulse motor
- Control : Joystick control (Auto Eucentric0
- Z(WD) : 5 ~ 35mm
- Rotation : 360'
- Tilt : 0 ~ 60' tilt
Wafer Loader : Manual loading
Electron optics : Electron gun
AS-IS condition

Shipping / Return Policies

Shipping Policies(Freight Shipping)

We are INTERNATIONAL SELLER from Republic of Korea
Shipping condition are based on AS-IS
Freight International Shipping : Ocean
Due to the sensitivity of the equipment, freight shipments will be shipped insured for the full purchase price with ocean-ride.
You will be notified within 1-3 business days after purchase for shipping charges and dimensions before an invoice can be sent.
Pallet, crating and/or barrier bags fees may apply when required for shipment.
You are welcome to arrange your own transportation, we will provide you with accurate dimensions of the freight

International Orders are subject to DUTIES, TAXES or other Import Fees; the bidder/buyer[s] is solely responsible for these fees, documents and transportation if held at a customs office in the destination country. In the event that you have questions about international shipping logistics please contact us before purchase.

Exchange / Return Policy

30-DAY SATISFACTION GUARANTEE

Customer satisfaction is our priority. If you are not completely satisfied with your purchase, please contact us within 30 days of your purchase and we will refund 100% of your purchase price. To expedite the process, please include all eBay item numbers.

All returns must include all original undamaged items, in resalable condition with all original packaging including manuals, warranty forms, etc.

Shipping and Handling fees are non-refundable. Buyer is responsible for return item shipping costs.