AVR Component Tester (RLC / ESR & Semiconductors Tester) Transistor Tester

latest firmware version 1.11K!

Firmware upgrade link:
avrtester.tode.cz/index.php?p=firmware

AVR ESR meter is a versatile automatic and simple meter / tester components. Tester component helps you find the defective part or unmarked component (not always be correctly detected, sometimes even more components detected in the device). It is only necessary that the equipment has been disconnected from the power supply and capacitors were DISCHARGED otherwise it will damage the MCU and its replacement is needed.
these reasons should be in ESR tester AVR MCU positioned in the socket for easy replacement.
device has a calibration option (only software for the ATmega 168 / 328). The meter can automatically detect the components regardless of the pin layout components and the measurement result appears on the 16x02 screen, which displays what kind of component it is, connection terminals and the measured values. The device can also facilitate the sorting of components.

Tester measures the components:

- Resistance 0,01Ω - 50MΩ
- Capacitors with ESR (ESR only with ATmega 168 / 328 ) 25pF - 100mF ESR values from 0,18μF only for tantalum capacitors is necessary to observe polarity - to pin 1 and pin + no. 2 or 3, or - to pin No.2 and No.3 + to pin otherwise the measured data may vary
- Automatic detection of NPN and PNP bipolar transistors, N and P channel MOSFET, JFET.
too can measure Thyristors and Triacs ( measures only 6 mA current means. sensitive semiconductor components only), open to semiconductor devices with higher current gate and Darlington with built-in resistors
- diodes and double diodes
- Coils (only with ATmega 168 / 328 ) 0,01mH - 20H with lower resolution
-Zener diodes to 50V (after adding an external voltage source according to manual) if not used Zener diodes measuring input can be used to measure the positive voltage 0-50V consumption without backlight is 11.5 mA 22.5 mA with backlight.

Last manuals in PDF from the official website with all parameters

Documentation in English: http://www.avrtester.tode.cz/upload/ttester_en.pdf

Documentation in German: http://www.avrtester.tode.cz/upload/ttester_de.pdf

Documentation in Russian: http://www.avrtester.tode.cz/upload/ttester_ru.pdf

Features


1. Operates with ATmega328 microcontrollers.

2. Displaying the results to a 2x16 or a 4x16 character LCD-Display.

3. One key operation with automatic power shutdown.

4. Battery operation is possible since shutdown current is only about 20nA.

5. Low cost version is feasible without crystal and auto power off. With software version 1.11k the sleep modus of the Atmega168 or ATmega328 is used to reduce current if no measurement is required.

6. Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs, JFETs, diodes, double diodes, Thyristors and Triacs.

7. Automatic detection of pin layout of the detected part.

8. Measuring of current amplification factor and Base-Emitter threshold voltage of bipolar transistors.

9. Darlington transistors can be identified by the threshold voltage and high current amplification factor.

10. Detection of the protection diode of bipolar transistors and MOSFETs.

11. Measuring of the Gate threshold voltage and Gate capacity value of MOSFETs.

12. Up to two Resistors are measured and shown with symbols and values with up to four decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the Tester (1-3). So Potentiometer can also be measured. If the Potentiometer is adjusted to one of its ends, the Tester cannot differ the middle pin and the end pin.

13. Resolution of resistor measurement is now up to 0.01Ω, values up to 50M Ω are detected.

14. One capacitor can be detected and measured. It is shown with symbol and value with up to four decimal digits in the right dimension. The value can be from 25pF (8MHz clock, 50pF @1MHz clock) to 100mF . The resolution can be up to 1pF (@8MHz clock].

15. For capacitors with a capacity value above 0.18µF the Equivalent Serial Resistance (ESR) is measured with a resolution of 0.01Ω and is shown with two significant decimal digits. This feature is only available for ATmega with at least 16K flash memory (ATmega168 or ATmega328).


16. For capacitors with a capacity value above 5000pF the voltage loss after a load pulse can be determined. The voltage loss give a hint for the quality factor of the capacitor.


17. Up to two diodes are shown with symbol or symbol in correct order. Additionally the flux voltages are shown.

18. LED is detected as diode, the flux voltage is much higher than normal. Two-in-one LEDs are also detected as two diodes.

19. Zener-Diodes can be detected, if reverse break down Voltage is below 4.5V. These are shown as two diodes, you can identify this part only by the voltages. The outer probe numbers, which surround the diode symbols, are identical in this case. You can identify the real Anode of the diode only by the one with break down (threshold) Voltage nearby 700mV!

20. If more than 3 diode type parts are detected, the number of founded diodes is shown additionally to the fail message. This can only happen, if Diodes are attached to all three probes and at least one is a Z-Diode. In this case you should only connect two probes and start measurement again, one after the other.

21. Measurement of the capacity value of a single diode in reverse direction. Bipolar Transistors can also be analyzed, if you connect the Base and only one of Collector or Emitter.

22. Only one measurement is needed to find out the connections of a bridge rectifier.

23. Capacitors with value below 25pF are usually not detected, but can be measured together with a parallel diode or a parallel capacitor with at least 25pF. In this case you must subtract the capacity value of the parallel connected part.

24. For resistors below 2100Ω also the measurement of inductance will be done, if your ATmega has at least 16K flash memory. The range will be from about 0.01mH to more than 20H , but the accuracy is not good. The measurement result is only shown with a single component connected.

25. Testing time is about two seconds, only capacity or inductance measurement can cause longer period.

26. Software can be configured to enable series of measurements before power will be shut down.

27. Build in selftest function with optional 50Hz Frequency generator to check the accuracy of clock frequency and wait calls (ATmega168 and ATmega328 only).

28. Selectable facility to calibrate the internal port resistance of port output and the zero offset of capacity measurement with the selftest (ATmega168 and ATmega328 only). A external capacitor with a value between 100nF and 20µF connected to pin 1 and pin 3 is necessary to compensate the offset voltage of the analog comparator. This can reduce measurement errors of capacitors of up to 40µF . With the same capacitor a correction voltage to the internal reference voltage is found to adjust the gain for ADC measuring with the internal reference.

29. Display the Collector cutoff current ICE0 with currentless base (10µA units) and Collector residual current ICES with base hold to emitter level (ATmega328 only). This values are only shown, if they are not zero (especially for Germanium transistors).

30. For the ATmega328 a dialog function can be selected, which enable additional functions. Of course you can return from dialog to the normal Transistor Tester function.


31. With dialog function you can use a frequency measurement at port PD4 of the ATmega. The resolution is 1 Hz for input frequencies above 25 kHz. For lower frequencies the resolution can be up to 0.001 mHz by measuring the mean period.

32. With the dialog function and without the activated serial output a external voltage of up to 50V can be measured with the 10:1 voltage divider at the PC3 port. If the PLCC-Version of the ATmega328 is used, one of the additional pins can be used for the voltage measurement together with the serial output. If the zener diode measurement extension (DC-DC converter) is assembled, the measurement of zener diodes is also possible with this function by pressing the key.

33. With the dialog function a frequency output can be selected at the TP2 pin (PB2 Port of the ATmega). Currently a preselection of frequencies from 1 Hz up to 2 MHz can be selected.

34. With the dialog function a fixed frequency output with selectable pulse width can be activated at the TP2 pin (PB2 port of the ATmega). The width can be enhanced with 1% by a short key press or with 10% by a longer key press.

35. With the dialog function can be started a separated capacity measurement with ESR measurement. Capacities from about 2µF up to 50mF can most be measured in circuit, because only a little measurement voltage of about 300mV is used. You should make sure, that all capacitors have no residual charge before starting any measurement.

Thyristors and Triacs can only be detected, if the test current is above the holding current. Some Thyristors and Triacs need as higher gate trigger current, than this Tester can deliver. The available testing current is only about 6mA! Notice that many features can only be used with microcontroller with enough program memory such as ATmega168. Only processors with at least 32k flash memory like ATmega328 or ATmega1284 can take all features.

Attention:

Always be sure to discharge capacitors before connecting them to the Tester! The Tester may be damaged before you have switched it on. There is only a little protection at the ATmega ports. Extra caution is required if you try to test components mounted in a circuit. In either case the equipment should be disconnected from power source and you should be sure, that no residual voltage remains in the equipment.

Package Include:

one pcs AVR tester board (including 1602 LCD)

please note: this package don't include any battery. (Post Office don't allow us to put "battery" in parcel)