Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials
Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution.
The focus of th is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials.
Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as:
For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.