The leeb hardness tester TMT-6560 is is a portable hardness testing set for the mobile and stationary employment. Battery operation and compact dimensions ensure a simple handling even in the mobile application. Due to the innovative design with its modern load release mechanism the TMT-6560 can do fast and precise measurements of metals. The extra small probe with 145mm x 20mm enables measurements in difficult accessible places, in any angle even headfirst. The device can be calibrated. In the scopy of delivery there is a calibration block. ![Image](https://ocstec.de/PIX/HT5_01.JPG) The results of the measurement you receive alternatively in Rockwell B & C, HRB & HRC, Vickers HV, Brinell HB, shore HS, Leeb HL. The 250 last groups including single measured value, impact direction, material and hardness scale etc. are stored fully automatic in the TMT-6560 memory and can be transfered with a RS-232 interface to your PC or notebook. Software and cables (SW2) are optional available in our shop. ![Image](https://ocstec.de/PIX/HT5_03.JPG) Product highlights: - DIN 53505, ISO 7619 and ASTM D 2240 conformal - Large measuring range with high resolution - Maintenance-free - Backlight digital display - High grade probe - Alu-Case - 9 different preselectable material types as steel, cast steel, tool steel, gray cast iron, aluminium, brass, bronze, copper... ![Image](https://ocstec.de/PIX/HT5_02.JPG) Technical details & application: Particularly in the materials technology hardness plays a huge role. The measured hardness of a body makes possible conclusions on its characteristics e.g. about how quickly it breaks or is being scratched. When using the dynamic Leeb principle, the hardness value is derived from the energy loss of a defined impact body after impacting on a metal sample, similarly to the Shore scleroscope. The Leeb quotient (vi,vr) is taken as measure of the energy loss by plastic deformation: the impact body rebounds faster from harder test samples than it does from softer ones, resulting in a greater value 1000×vr/vi. |