Item
- Make: Agilent/Keysight
- Model: 4155B
Item Specifics/Condition
To be tested prior to shipment (Cal & ext warranty available upon request)
Description
Semiconductor Parameter Analyzer
Description
The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating screen markers, measures leakage characteristics with ultra-low leakage SMUs, automates device characterization with integrated pulse generators and selector switches.
Features:
- High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1V to 200 V
- Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
- Synchronized stress/measure function, two high-voltage pulse generator units (40 V)
- Time-domain measurement: 60s variable intervals, up to 10,001 points
- Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
- Automation: built-in HP Instrument BASIC, trigger I/O capability
Images
![](https://alltest.ezmeasurement.com/storage/servlet/Image?c=7022&fileName=tmp_6103332375293751536.jpg&contentType=image%2Fjpeg)
Term of sale
Included Items: This sale does not include probes, cables, manuals,power cords or any other accessories unless otherwise stated or pictured.